Fordham University            The Jesuit University of New York
 


CIS Department Talk - May 2, 2005

The Department of Computer and Information Science & The Society of Computer Science Present

Speaker:Dr. Tin Kam Ho, Bell Labs, Lucent Technologies
Topic:Mirage: A Tool for Interactive Pattern Discovery"
Date:Monday May 2, 2005; 2:30pm
Place:John Mulcahy Hall, Room 403


Abstract:

Pattern discovery often occurs in studying correlations of data viewed from multiple perspectives. For high dimensional, low level sensory data such as images, it is especially important that the input can be studied in its raw form along with relevant attributes from the application contest and all intermediate results of manual or automatic analysis. To facilitate this, flexible and effective data analysis tools that can handle diverse data types, a wide range of objectives, large data volumes, and variable demands on speed are in critical need. I will describe our experiences with Mirage (http://www.cs.bell-labs.com/who/tkh/mirage), a research software tool for open-ended interactive pattern discovery. I will show the tool's applications in analyzing photonics simulations, evaluating performances of telecommunication systems, and in the Virtual Observatory. I will also discuss directions for future research on how to organize the tool to lay a solid foundation for meeting these needs and enabling continuous growth.


Bio:

Tin Kam Ho is a Distinguished Member of Technical Staff in the Computing Sciences Research Center of Bell Laboratories. Her interests are in pattern recognition, data mining, and computational modeling and simulation. She received a Ph.D. in Computer Science from SUNY at Buffalo in 1992. She has served on the editorial boards of several journals, and is currently Editor-in-Chief of the journal Pattern Recognition Letters. In 1999 she received the ICDAR Young Scientist Award for her contributions to document image analysis. She is a Fellow of IAPR, and has received six U.S. patents for her work in classification and image analysis.


For more information, contact:
Ms. Diane Roche (718) 817-4480; (roche@cis.fordham.edu)
 

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